Wafer Holders with Pin for Wafers with a Flat; 1 - 6

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Description

Wafer Holders with Pin for Wafers with a Flat; 1 - 6"DESCRIPTION SEM Pin Mount Specimen Holders for Scanning Electron Microscopy A large selection of SEM specimen holders for SEMs, FESEMs, and FIB systems, which are using the standard 3. 2mm (1 8") pin type mount. Some of the larger holders require a larger specimen chamber and a larger stage. Depending on the available distance, Z movement and maximum specimen height provided by the specimen stage in the SEM, pin stub extenders might be added to obtain

CP-II DESCRIPTION

reflective coating are recommended for thin cantilevers

depending on contact radius measured on a silver surface

MRS-4 X-Y/R Cleaning

01844T - Carbon Film only on 400 mesh

Width x Thickness 5026-7 Ceramic Tweezers

High abrasion resistance

with PEAKFORCE-HIRS-SSB probes

Specimen holder for 2" or 50mm metallographic mounts

HOPG is widely used as a substrate for specimens to be examined in scanning probe microscopes (SPM

10e5 enhancement is achievable routinely with the TERS-AFM probes on the TERS-SMPL using Innova-IRIS and tuning fork FM feedback

45° Pre-Tilt Holder